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Dean Williams named Microanalysis Society Fellow

This week at the Microscopy & Microanalysis 2018 Meeting in Baltimore, Dean David B. Williams was honored as a member of the Microanalysis Society's inaugural class of fellows.

Dean David B. Williams (right) with his colleague and co-author of several textbooks, University of Connecticut Prof. C. Barry Carter, who is also part of the 2018 Fellows class.MAS Fellow is a designation that is intended to recognize eminent scientists, engineers, and technologists in the field of microanalysis of materials and related phenomena who have distinguished themselves through outstanding research and service to the microanalysis community. This includes, but is not limited to technique development, applications, theory development, and distinguished service to the society. Election as an MAS Fellow is highly selective but should represent a broad cross-section of the MAS membership. They are elected by their peers.

Dean Williams was recognized for outstanding leadership and sustained contributions to analtyical transmission electron microscopy theory and practice.

A native of Leeds, England, Williams holds B.A., M.A., Ph.D. and Sc.D. degrees from the University of Cambridge. He is a strong advocate for excellence in education and research, and is co-author and editor of 13 textbooks and conference proceedings and author or co-author of over 400 publications on the application of electron microscopy to studies of metals and alloys. He is co-author with MAS Fellow Professor C. Barry Carter of the leading textbook, Transmission Electron Microscopy, which has sold over 20,000 copies and over 1 million chapter downloads.

With 28 members, this first group of MAS Fellows will be known as the Legends Class.